New DFT & TFD Technology
Test for Design
/ Design For Test & Test For Design
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The Tw-CAD
offers quite positive promises for your circuit :
- if your circuit is
testable enough then high quality ATPG is certainly possible
- else circuit modifications are automatically generated to make ATPG
possible
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Is your circuit testable enough? Testability is compared with threshold below which ATPG still possible
with Tw-CAD
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It is easy
for you to follow DFT tips on changing your circuit to make the ATPG possible
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It is clear for you to plan for fault coverage predicted before & after circuit changed
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The Tw-CAD performs very time-taking job for ATPG permitting for designer's creative work onto project
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According to this technology, You
- send us Netlist (this is the only primary data)
- receive recommendations on circuit modifications to insert the better control where we shall said and the better observation where we shall said (extra needed pins are payment for DFT )
- send us the (changed secondary Netlist)
- receive high quality tests (TFD) to check your circuit
According to this technology we:
- calculate controlability and observability measures for your circuit( DFT analysis )
- ñcompare above measures with those when ATPG is possible with the Tw-CAD that is to predict fault coverage (it is absent in conventional systems)
- automatically generate recommendations on circuit modifications, some additional inputs for better control and some additional outputs for better observation that is to improve fault coverage (more than conventional DFT analysis pointing out difficulties without constructive suggestions)
- predict fault coverage before and after DFT (more than conventional DFT analysis)
- generate complete set of tests after project met to DFT demands and verification is OK (the ATPG is rare feature in conventional CADs especially based upon IBM-PC)
- on your special demand it is possible the ATPG of verification test
- on your special demand it is possible to check buses for uniqueness of source
- adapt tests to your CAD or tester
Example here *
book DFT & Test fromTestWard Lab *
